Wednesday, January 9, 2013

1301.1377 (Z. Xiao et al.)

Domain wall roughness and creep in nanoscale crystalline ferroelectric

Z. Xiao, Shashi Poddar, Stephen Ducharme, X. Hong
We report the study of the static and dynamic properties of domain walls (DWs) in 11 to 36 nm thick films of crystalline ferroelectric poly(vinylidene-fluoride-trifluorethylene). Piezo-response force microscopy studies reveal the DW roughness exponent {\zeta} to be 0.39 to 0.48 and the DW creep exponent {\mu} to be 0.20 to 0.28, in good agreement with weak random bond disorder and yielding a thickness-independent effective dimensionality of 1.5. Our results suggest predominantly 2D ferroelectricity in the layered polymer and we attribute the fractal dimensionality to the correlations between the in-plane and out-of-plane polarization.
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